南京大学亚原子电镜研究实验室王鹏教授招2017年入学博士研究生

南京大学材料系王鹏教授南京大学亚原子电镜研究实验室诚征硕士、博士研究生，目前研究实验室拥有先进的两台高分辨透射电镜及其它与电镜相关的设备，具有良好的科研条件。真诚欢迎热爱科研、对工作积极认真、有材料、物理、化学、光学等相关背景的同学加入我们的团队，并希望在硕博期间有所建树。待遇按照南京大学统一政策执行，并根据表现给予补助。 A I2) g1m  
有意报考者请发邮件至：wangpeng@nju.edu.cn : $1?i)  
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研究领域和方向： Fe*R  
1.低维纳米材料及材料界面的原子分辨率的表征；（具有低维功能纳米材料的制备等背景优先） >>r(/81S  
2.超高分辨电子成像技术开发及其应用；（具有傅里叶光学，物理光学，Matlab编程的背景优先） u,ho7ht3(  
3.先进球差校正显微表征、原位动态观测及EELS谱学的应用；（具有材料、物理、化学的背景） 6q
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导师简介： K8|r&`X0  

	王鹏
	教授
	办公室地址：	鼓楼校区科学楼1102；仙林校区亚原子分辨电镜室（天文楼后）
	办公室电话：	025-89681519
	Email：  wangpeng@nju.edu.cn

个人主页： [url]https://www.researchgate.net/profile/Peng_Wang134[/url]

实验室主页：

研究方向：

1.低维纳米材料及材料界面的原子分辨率的表征； 2.三维成像电镜技术及其应用 3.先进球差校正显微技术及其应用

开设课程：

先进透射电子显微学

个人简介：

王鹏，首批国家青年千人计划入选者，现为南京大学现代工程与应用科学学院教授。本科毕业于哈尔滨工业大学，硕士毕业于韩国庆北大学，随后赴英国利物浦大学从事超高分辨率电子显微透射镜在材料表征上的应用及研究，2006年获得博士学位。先后在英国国家超高分辨率电子显微镜实验室SuperSTEM和牛津大学材料系电子显微镜组作博士后研究。 迄今已在国际权威学术杂志发表论文三十余篇，其中作为第一作者发表SCI论文10篇（《物理评论快报》两篇，《Ultramicroscopy》两篇），合作在《自然》子篇等上发表两篇文章。） 在国际学术会议上口头大会报告十三次，其中两次特邀。2011 年被英国皇家物理学院（Institute of Physics）选入正式会员(MInstP)。目前在南京大学负责亚原子分辨率透射电子显微镜实验室的运行及科研管理工作。（2012年购进两台高分辨透射电子显微镜，包括一台具有双球差校正器及单色仪的扫描透射电子显微镜）。 研究专长为利用球差校正的扫描透射电子显微镜成像技术和电子能量损失能谱来研究材料原子尺度上的结构以及性能，成功的研究确定了量子点，石墨烯，纳米线等一系列新型纳米材料的二维和三维结构。独立开发的扫描共聚焦电子成像技术首次突破了三维立体图像在层析方向上小于10纳米并有化学选择性的层析度。近两年的研究方向主要侧重于开发新的电子成像技术来实现新型纳米结构和原子级结构的三维重建以及决定其化学成分在三维结构中的分布。

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文章:

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D’Alfonso, A.V. Martin, A.J. Morgan, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Generalized Fourier Holography Meets Coherent Diffractive Imaging, Microscopy Today, 23 (2015) 28-33. oH?b}T=9jz   [10] X. Chang, S. Wang, Q. Qi, M.A. Gondal, S.G. Rashid, D. Yang, M.A. Dastageer, K. Shen, Q. Xu, P. Wang, Constrained growth of ultrasmall BiOCl nanodiscs with a low percentage of exposed {001} facets and their enhanced photoreactivity under visible light irradiation, Applied Catalysis B: Environmental, 176-177 (2015) 201-211. O`kl\K*R7   [11] X. Chang, S. Wang, Q. Qi, M.A. Gondal, S.G. Rashid, S. Gao, D. Yang, K. Shen, Q. Xu, P. Wang, Insights into the growth of bismuth nanoparticles on 2D structured BiOCl photocatalysts: an in situ TEM investigation, Dalton Trans, (2015). _Ay9p[l   [12] L. Xie, P. Wang, X.Q. Pan, A perturbation theory study of electron vortices in electromagnetic fields: the case of infinitely long line charge and magnetic dipole, Micron, 63 (2014) 9-14. G$"h&Xy1c   [13] L.L. Fan, S. Chen, Z.L. Luo, Q.H. Liu, Y.F. Wu, L. Song, D.X. Ji, P. Wang, W.S. Chu, C. Gao, C.W. Zou, Z.Y. Wu, Strain dynamics of ultrathin VO(2) film grown on TiO(2) (001) and the associated phase transition modulation, Nano Lett, 14 (2014) 4036-4043. Qy<P463A(l   [14] A.J. D'Alfonso, A.J. Morgan, A.W.C. Yan, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Deterministic electron ptychography at atomic resolution, Physical Review B, 89 (2014). <$$yw=ef   [15] J. Benson, Q. Xu, P. Wang, Y. Shen, L. Sun, T. Wang, M. Li, P. Papakonstantinou, Tuning the catalytic activity of graphene nanosheets for oxygen reduction reaction via size and thickness reduction, ACS Appl Mater Interfaces, 6 (2014) 19726-19736. fplow   [16] P. Wang, A.J. D'Alfonso, A. Hashimoto, A.J. Morgan, M. Takeguchi, K. Mitsuishi, M. Shimojo, A.I. Kirkland, L.J. Allen, P.D. Nellist, Contrast in atomically resolved EF-SCEM imaging, Ultramicroscopy, 134 (2013) 185-192. eQm 1cgMdz   [17] A. Shmeliov, J.S. Kim, K.B. Borisenko, P. Wang, E. Okunishi, M. Shannon, A.I. Kirkland, P.D. Nellist, V. Nicolosi, Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets, Nanoscale, 5 (2013) 2290-2294. k"%~"9   [18] A.J. Morgan, A.J. D’Alfonso, P. Wang, H. Sawada, A.I. Kirkland, L.J. Allen, Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution, Physical Review B, 87 (2013). :pY/-Cgv   [19] X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, P. Wang, P.D. Nellist, A.I. Kirkland, M. Tezuka, M. Shimojo, Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy, J Electron Microsc (Tokyo), 61 (2012) 159-169. (,\+tr8r8   [20] P. Wang, A.I. Kirkland, P.D. Nellist, A.J. D’Alfonso, A.J. Morgan, L.J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanalysis, 18 (2012) 532-533. r,3DTBe   [21] P. Wang, A.I. Kirkland, P.D. Nellist, Chromatic Confocal Electron Microscopy with a Finite Pinhole Size, Journal of Physics: Conference Series, 371 (2012) 012002. .VJMz4$] O   [22] P. Wang, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Y. Zhu, M. Okuda, A.I. Kirkland, P.D. Nellist, Three-dimensional elemental mapping of hollow Fe2O3@SiO2 mesoporous spheres using scanning confocal electron microscopy, Applied Physics Letters, 100 (2012) 213117. -Cpl?Io`r5   [23] A. Shmeliov, M. Shannon, P. Wang, P.D. Nellist, V. Nicolosi, Imaging and diffraction characterisation of 2D inorganic nanostructures, Journal of Physics: Conference Series, 371 (2012) 012071. 8 >EWKI 9   [24] G. Ruben, P. Wang, A.J. D'Alfonso, P.D. Nellist, L.J. Allen, Nanohalos: a manifestation of electron channelling in gold nanoparticles, Ultramicroscopy, 120 (2012) 10-15. [b%D3-}'   [25] P.D. Nellist, P. Wang, Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope, Annual Review of Materials Research, 42 (2012) 125-143. wssRA?9<   [26] L. Jones, P. Wang, P.D. Nellist, Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM), Journal of Physics: Conference Series, 371 (2012) 012003. oulVg];   [27] A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, P.D. Nellist, A.I. Kirkland, M. Takeguchi, Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy, Applied Physics Letters, 101 (2012) 253108. DJ k/{Z:   [28] P. Wang, G. Behan, A.I. Kirkland, P.D. Nellist, E.C. Cosgriff, A.J. D'Alfonso, A.J. Morgan, L.J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope, Ultramicroscopy, 111 (2011) 877-886. /SR*W5#s   [29] G. Mountjoy, D. Loche, P. Wang, K. Sader, A. Corrias, Scanning Transmission Electron Microscopy Study of the Evolution of Needle-Like Nanostructures in CoFe2O4and NiFe2O4Silica Nanocomposite Aerogels, The Journal of Physical Chemistry C, 115 (2011) 5358-5365. VA>35w   [30] P. Wang, G. Behan, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo, A.I. Kirkland, P.D. Nellist, Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope, Physical Review Letters, 104 (2010). ~ 'cmSiz-   [31] P. Wang, G. Behan, A.I. Kirkland, P.D. Nellist, Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope, Journal of Physics: Conference Series, 241 (2010) 012012. \ a<h/4#|   [32] M. Takeguchi, M. Okuda, A. Hashimoto, K. Mitsuishi, M. Shimojo, X. Zhang, P. Wang, P.D. Nellist, A.I. Kirkland, Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy, Microscopy and Microanalysis, 16 (2010) 1836-1837. jD]~ AwRJ   [33] K. Sader, B. Schaffer, G. Vaughan, P. Wang, A.L. Bleloch, R. Brydson, A. Brown, Smart Acquisition EELS, Journal of Physics: Conference Series, 241 (2010) 012010. ]@c+]{   [34] P.D. Nellist, P. Wang, G. Behan, A.I. Kirkland, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. Cosgriff, A.J. D'Alfonso, L.J. Allen, S.D. Findlay, Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy, Microscopy and Microanalysis, 16 (2010) 1834-1835. P6`u._mX   [35] A.R. Lupini, P. Wang, P.D. Nellist, A.I. Kirkland, S.J. Pennycook, Aberration measurement using the Ronchigram contrast transfer function, Ultramicroscopy, 110 (2010) 891-898. zkrM/ @p#   [36] A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A.I. Kirkland, P.D. Nellist, M. Takeguchi, Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope, Microscopy and Microanalysis, 16 (2010) 1888-1889. 85$m[+md   [37] E.C. Cosgriff, P.D. Nellist, A.J. D'Alfonso, S.D. Findlay, G. Behan, P. Wang, L.J. Allen, A.I. Kirkland, Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy, 162 (2010) 45-76. 6r0krbN   [38] C. Bernuy-Lopez, D. Pelloquin, B. Raveau, M. Allix, J.B. Claridge, M.J. Rosseinsky, P. Wang, A. 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Bleloch, Contrast Reversal in Atomic-Resolution Chemical Mapping, Physical Review Letters, 101 (2008). ;(/ZO%h   [43] P. Wang, A.L. Bleloch, L. Yan, H.J. Niu, P.R. Chalker, M.J. Rosseinsky, P.J. Goodhew, Aberration corrected STEM of defects in epitaxial n=4 Ruddlesden-Popper phase Can+1MnnO3n+1, Journal of Physics: Conference Series, 126 (2008) 012050. WIT>!|w_   [44] M.H. Gass, U. Bangert, A.L. Bleloch, P. Wang, R.R. Nair, A.K. Geim, Free-standing graphene at atomic resolution, Nat Nanotechnol, 3 (2008) 676-681. vn!3l1\+J   [45] A.L. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, P. Wang, Aberration corrected STEM and EELS: Atomic scale chemical mapping, (2008) 1-2. F=e8IUr   [46] J.E. Allen, E.R. Hemesath, D.E. Perea, J.L. Lensch-Falk, Z.Y. Li, F. Yin, M.H. Gass, P. Wang, A.L. Bleloch, R.E. Palmer, L.J. Lauhon, High-resolution detection of Au catalyst atoms in Si nanowires, Nat Nanotechnol, 3 (2008) 168-173. zuad~%D<I   [47] D. Carta, G. Mountjoy, M. Gass, G. Navarra, M.F. Casula, A. Corrias, Structural characterization study of FeCo alloy nanoparticles in a highly porous aerogel silica matrix, J Chem Phys, 127 (2007) 204705. ?m} s4a   [48] P. Wang, A.L. Bleloch, U. Falke, P.J. Goodhew, Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM, Ultramicroscopy, 106 (2006) 277-283. m)t;9J5   [49] P. Wang, A.L. Bleloch, M. Falke, P.J. Goodhew, J. Ng, M. Missous, Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy, Applied Physics Letters, 89 (2006) 072111. R6Km\N   Oi'5ytsES   [50] A. Bleloch, P. Wang, U. Falke, P. Goodhew, High Angle Annular Dark Field Imaging On and Away from the Pole, Microscopy and Microanalysis, 11 (2005). Nh o>f

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